idw – Informationsdienst Wissenschaft

Nachrichten, Termine, Experten

Grafik: idw-Logo
Science Video Project
idw-Abo

idw-News App:

AppStore

Google Play Store

Veranstaltung


institutionlogo


12.04.2021 - 14.04.2021 | Online

Laboratory X-ray techniques for materials development and process control

Advanced materials are increasingly enablers for high-tech products. The improved understanding of structure-property relationships of these materials is essential for their applications in many branches. Materials characterization provides the needed information about atomic structure, chemical binding and the 3D microstructure of advanced materials.

Within this context, high-resolution X-ray techniques are playing an important role for the development and introduction of new technologies as well as for the integration of advanced materials into high-tech products, and particularly for process control and for quality assessment. One unique advantage of the X-ray techniques is that they deliver – generally integral – data for bulk materials and thin films nondestructively.

DAY 1

X-ray techniques: Fundamentals, techniques and tools

09:00
Welcome and introduction: Fundamentals of X-ray physics
- Historical development, major inventions
- X-rays: Refraction, reflection, diffraction
- X-ray diffraction, spectroscopy, radiography/tomography
- Status and expected future developments
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

10:45
X-ray experiments: Laboratory sources vs. synchrotron
- Generation of X-rays
- The integrated setup: Laboratory tool vs. synchrotron beamline
Dr. Jörg Grenzer, Helmholtz Zentrum Dresden-Rossendorf (Germany)

12:00
X-ray experiments: Optics and detectors
- X-ray optics: Reflective and diffractive optics
- X-ray detectors: 0D, 1D, 2D
Dr. Jörg Grenzer, Helmholtz Zentrum Dresden-Rossendorf (Germany)

DAY 2

Structure of materials, texture and stress: X-ray diffraction

09:00
X-ray diffraction: Structure and microstructure of crystalline materials
- Fundamentals of X-ray diffraction
- X-ray structure and microstructure analysis
- Texture and stress analysis
- Applications in materials science
Prof. Dr. David Rafaja, Technical University Bergakademie Freiberg (Germany)

3D imaging of materials: X-ray tomography and microscopy

10:45
X-ray tomography: 3D morphology and microstructure of materials
- Fundamentals of X-ray microscopy
- Radiography and high-resolution computed X-ray tomography
- Data analysis including AI algorithms
- Applications in materials science and biology
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

12:00
In-situ and operando X-ray microscopy studies
- X-ray microscopy at several photon energies
- In-situ mechanical studies at composites and microchips
- Operando studies at systems for energy storage and conversion
MSc. Kristina Kutukova, Fraunhofer IKTS Dresden | Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

DAY 3

Composition of materials and chemical binding: X-ray spectroscopy

09:00
X-ray fluorescence spectroscopy: Elemental composition
- Fundamentals of X-ray fluorescence spectroscopy
- From point analysis to elemental mapping
- Scanning micro-XRF - a technique for qualitative and quantitative materials analysis
Dr. Roald Tagle, Bruker Nano, Berlin (Germany)

10:15
X-ray absorption spectroscopy: Local atomic and electronic structures of nanostructured materials
- Fundamentals of X-ray absorption spectroscopy, EXAFS and XANES analysis
- From ex-situ to operando XAS studies
- Applications in battery research, catalysis and biomedicine
Prof. Dr. Alexander V. Soldatov, University Rostov-on-Don (Russia)

Advanced data analysis

11:30
Big Data and AI algorithms for the analysis of X-ray spectroscopy data
- The need of Big Data
- Machine learning (ML) benefits
- Examples of ML applications in materials characterization
- Challenges and limits of the AI technologies
Prof. Dr. Alexander V. Soldatov, University Rostov-on-Don (Russia)

12:30
Summary and final remarks
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

Hinweise zur Teilnahme:
Event Dates in detail:

Day ONE: 9 AM - 1 PM
Day TWO: 9 AM - 1 PM
Day THREE: 9 AM - 1 PM

Dial-in Information will be send by e-mail to the participants one day before the training course starts.

The software ZOOM will be used for the training course.

Termin:

12.04.2021 ab 09:00 - 14.04.2021 13:00

Veranstaltungsort:

Online
Online
Nordrhein-Westfalen
Deutschland

Zielgruppe:

Wirtschaftsvertreter, Wissenschaftler

E-Mail-Adresse:

Relevanz:

international

Sachgebiete:

Werkstoffwissenschaften

Arten:

Seminar / Workshop / Diskussion

Eintrag:

02.02.2021

Absender:

Jörg Bähren

Abteilung:

Kommunikation & Medien

Veranstaltung ist kostenlos:

nein

Textsprache:

Englisch

URL dieser Veranstaltung: http://idw-online.de/de/event67858


Hilfe

Die Suche / Erweiterte Suche im idw-Archiv
Verknüpfungen

Sie können Suchbegriffe mit und, oder und / oder nicht verknüpfen, z. B. Philo nicht logie.

Klammern

Verknüpfungen können Sie mit Klammern voneinander trennen, z. B. (Philo nicht logie) oder (Psycho und logie).

Wortgruppen

Zusammenhängende Worte werden als Wortgruppe gesucht, wenn Sie sie in Anführungsstriche setzen, z. B. „Bundesrepublik Deutschland“.

Auswahlkriterien

Die Erweiterte Suche können Sie auch nutzen, ohne Suchbegriffe einzugeben. Sie orientiert sich dann an den Kriterien, die Sie ausgewählt haben (z. B. nach dem Land oder dem Sachgebiet).

Haben Sie in einer Kategorie kein Kriterium ausgewählt, wird die gesamte Kategorie durchsucht (z.B. alle Sachgebiete oder alle Länder).