The atomic force microscope (AFM) has become a standard and wide spread instrument for characterizing nanoscale devices and can be found in most of today’s research and development areas. The NanoBits project provides exchangeable and customizable scanning probe tips that can be attached to standard AFM cantilevers offering an unprecedented freedom in adapting the shape and size of the tips to the surface topology of the specific application.
NanoBits themselves are 2‐4 um long and 120‐150 nm thin flakes of heterogeneous materials fabricated in different approaches. These novel tips will allow for characterizing three dimensional high‐aspect ratio and sidewall structures of critical dimensions such as nanooptical photonic components and semiconductor architectures which is a bottle‐neck in reaching more efficient manufacturing techniques. It is thus an enabling approach for almost all future nanoscale applications.
As the project is in its final stage, it will be presented to an interested public. All six European partners will present the results and the participants are then available for discussion.
Schedule:
14:30 h
Welcome of Participants; Networking
14.45 h
Overview: The NanoBits project
Dr. Albert Sill
OFFIS e.V., Germany
15.15 h
Cantilever Development for Exchangeable and Customizable Scanning Probe Tips for 3‐D AFM
Dr. Oliver Krause
NanoWorld Services GmbH,Germany
15.45 h BREAK
16.00 h
Design and Fabrication of NanoBits
Dr. Alexey Savenko
DTU Nanotech, Denmark
16.30 h
Assembly of NanoBits;3D Scanning Modes
Malte Bartenwerfer
OFFIS e. V., Germany
17.00 h BREAK
17.15 h
Tip‐Enhanced Raman Spectroscopy with NanoBits: New Opportunities for Materials Characterization atthe Nanoscale
Dr. Victor LeNader
EMPA, Switzerland
17.45 h
High Performance Optical Micro andNanostructures
Maria Oliva
Fraunhofer IOF, Germany
18.15 h END
Information on participating / attending:
Date:
06/18/2013 14:30 - 06/18/2013 18:30
Event venue:
Hotel Diagonal Zero
Conference Room Africa
Plaza Llevant, s/n,
08019 Barcelona
Spain
Target group:
Journalists, Scientists and scholars
Email address:
Relevance:
international
Subject areas:
Electrical engineering, Information technology, Materials sciences, Mechanical engineering
Types of events:
Seminar / workshop / discussion
Entry:
05/17/2013
Sender/author:
Ann-Kathrin Sobeck
Department:
Marketing und Kommunikation
Event is free:
no
Language of the text:
English
URL of this event: http://idw-online.de/en/event43695
You can combine search terms with and, or and/or not, e.g. Philo not logy.
You can use brackets to separate combinations from each other, e.g. (Philo not logy) or (Psycho and logy).
Coherent groups of words will be located as complete phrases if you put them into quotation marks, e.g. “Federal Republic of Germany”.
You can also use the advanced search without entering search terms. It will then follow the criteria you have selected (e.g. country or subject area).
If you have not selected any criteria in a given category, the entire category will be searched (e.g. all subject areas or all countries).