Multi-scale materials characterization and multi-scale modelling are needed for further materials research and development.
High-resolution analytical techniques are essential for both development and introduction of new nanotechnologies and thin-film technologies as well as for the integration of advanced materials into high-tech products. Nanoanalysis is more and more needed for process and materials characterization during manufacturing of nanostructured systems and devices as well as for the understanding of nanoscale microstructure in materials. Therefore, research and development in the field of physical analysis increasingly focused on the study of thin films and nanostructures. Application-specific developments show often that the combination of several analysis techniques is needed to ensure both process control in nanotechnology as well as performance and reliability of new products.
Numerous new developments in the field of nanoanalysis allow the imaging as well as the structural and chemical characterization of structures in the range < 100 nm, down to atomic dimensions. The suitability of a technique for research and development or for process control in manufacturing is determined by the capabilities and limits of the technique itself, particularly if the technique is destructive or non-destructive, but also from the time needed for data acquisition and data analysis (“time-to-data”).
The course will provide knowledge in the field of nanoanalysis. Starting with a short introduction, new techniques for the characterization of thin films, nanostructures and nanoparticles will be explained. New results from fundamental research will be presented, and application-specific solutions will be demonstrated as well. Challenges to nanoanalysis techniques in the industry will be an additional topic. Special examples for applied studies in micro-, nano- and optoelectronics as well as in the fields of renewable energies and lightweight construction will be demonstrated. Nanoanalytical studies at metallic, inorganic-nonmetallic and organic materials will be reviewed.
All lecturers are experienced experts in the field of physical and chemical analysis.
The course is intended for individuals who wish to expand their knowledge in the field of nanscale materials and nanoanalysis. The subjects covered in this course extend from fundamentals of materials science and analysis to the current nanotechnologies and challenges in industry. Scientists, engineers and technicians working in industry, research and education, who are interested to extend their knowledge in nanoanalysis, will benefit from this course.
Chairman of the seminar is Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis, Germany.
Find detailed information at
http://www.dgm.de/fortbildung/?tgnr=1846&lg=en
Information on participating / attending:
Participation fee: 1.290,- EURO
Fee for Members of the DGM: 1.190 EURO
Personal members or 1 non-member from a member institute / member company
The fee includes:
Scanning electron microscopy/ Focused ion beam Particle analysis Scanning probe microscopy.
Attendance of the seminar sessions, Comprehensive handouts, Refreshments during the coffee breaks, Lunch and dinner*
(* incl.19% VAT.)
Date:
06/09/2015 - 06/11/2015
Event venue:
Fraunhofer IKTS
Maria-Reiche-Straße 2
01109 Dresden
Sachsen
Germany
Target group:
Business and commerce, Scientists and scholars
Email address:
Relevance:
transregional, national
Subject areas:
Chemistry, Materials sciences, Mechanical engineering, Physics / astronomy
Types of events:
Seminar / workshop / discussion
Entry:
03/25/2015
Sender/author:
Susanne Grimm
Department:
Pressereferat
Event is free:
no
Language of the text:
English
URL of this event: http://idw-online.de/en/event50384
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