The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing will be discussed by experts from industry, government, and academia at the 2015 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, to be held in Dresden, Germany, April 14-16, 2015 at the Hilton Dresden.
As the devices lying at the heart of computing shrink ever closer to fundamental limits, the semiconductor industry must confront the problem of what to do when conventional microprocessors simply cannot shrink any further. Today's transistor features are 10000 times smaller than the diameter of a human hair, which provides challenges to and needs new solutions from analytics and metrology. The bi-yearly conference should be of interest to anyone concerned about the future of semiconductor manufacturing—a $300 billion industry.
Highlights include three successive keynote addresses beginning at 9 a.m., Tuesday, April 14, by Nobel Prize winner Klaus von Klitzing, Max-Planck-Institut FKF; Suresh Venkatesan, Senior Vice President, Technology Development, Global Foundries; and Hubert Lakner, Executive Director, Fraunhofer Group Microelectronics. A full conference program is available at http://nist.gov/pml/div683/conference/.
Ehrenfried Zschech, Chair of this year's International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, is proud to host the top experts in the fields of process and quality control from semiconductor industry, research centers and universities from all over the world. The globally active community appreciates the excellent competences of Dresden’s researchers, organized in the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA), a network of nine Fraunhofer institutes located in Saxony, and the Dresden Center for Nanoanalysis (DCN) at Technical University Dresden.
Information on participating / attending:
Date:
04/14/2015 - 04/16/2015
Event venue:
Hilton Dresden Downtown
Dresden
Sachsen
Germany
Target group:
Business and commerce, Scientists and scholars
Relevance:
international
Subject areas:
Electrical engineering, Materials sciences, Mechanical engineering
Types of events:
Conference / symposium / (annual) conference
Entry:
03/31/2015
Sender/author:
DC Katrin Schwarz
Department:
Presse- und Öffentlichkeitsarbeit
Event is free:
no
Language of the text:
English
URL of this event: http://idw-online.de/en/event50426
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