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Veranstaltung



15.08.2005 - 18.08.2005 | Bad Essen

8th International Conference on Non-Contact Atomic Force Microscopy / NC-AFM 2005

The NC-AFM 2005 continues a series of conferences devoted to research at the frontiers of science, technology and theory of non-contact scanning force microscopy and spectroscopy. The conference series aims at developing the technique for a broad range of applications in the nanosciences with an emphasis on atomic resolution imaging in the ultra-high vacuum. Prominent topics are atomic resolution imaging on insulating surfaces, imaging and manipulating individual molecules and self assembled monolayers as well as high resolution characterisation of biological system approached by small amplitude techniques in liquid environment.

Non-Contact Atomic Force Microscopy (NC-AFM) is a dynamic scanning force microscopy technique mostly performed in the ultra-high vacuum that allows highest resolution imaging of any well prepared surface.

The technique is the only one capable of atomic resolution imaging on insulating surfaces and yields imaging results on semiconductor surfaces that are complementary to those obtained by scanning tunnelling microscopy. Molecular and sub-molecular resolution is now readily obtained on individual molecules as well as self assembled monolayers while biological applications are approached by small amplitude imaging in liquid environment or at cryogenic temperatures.

The method of force spectroscopy allows a chemical characterisation at the atomic scale while Kelvin Probe and related techniques allow highly resolved imaging of charges and variations in work function. The development of the basic knowledge and instrumentation of the technique has always been accompanied by strong activities in theoretical studies on fundamental interaction mechanisms and a simulation and quantitative interpretation of images and spectroscopy results.

The conference welcomes contributions dealing with one or more of the following topics:

1. Instrumentation and techniques
2. Small amplitude and lateral force measurements
3. Atomic resolution imaging on insulating substrates
4. Atomic resolution imaging on molecular systems
5. Highest resolution imaging of cluster and biomolecules
6. Atomic scale manipulation and tunneling phenomena
7. Theoretical analysis of contrast mechanisms
8. Simulation of images and virtual SFM systems
9. Measuring tip-sample interaction potentials and mapping force fields
10. Mechanisms for damping and energy dissipation
11. Tapping mode versus non-contact mode imaging
12. Imaging and spectroscopy in liquid environments
13. Measuring nanoscale charges, work function and magnetic properties
14. Characterisation and modification of force microscopy tips at the atomic scale

The conference in Bad Essen (Germany) continues the series of international conferences that have been held in Osaka, Japan (1998); Pontresina, Switzerland (1999); Hamburg, Germany (2000); Kyoto, Japan (2001); Montreal, Canada (2002); Dingle, Ireland (2003); and Seattle, USA (2004).

Hinweise zur Teilnahme:
Organiser:
University of Osnabrueck

Contact:
Wolfgang Mikosch
University of Osnabrueck
Barbarastrasse 7
49076 Osnabrueck
+49 541 969 3344

Termin:

15.08.2005 - 18.08.2005

Veranstaltungsort:

The conference will be held at Höger's Hotel in Bad Essen (Germany) located in the district of Osnabrück. For poster sessions and recreation, we will move to Schloß Ippenburg.
49152 Bad Essen
Niedersachsen
Deutschland

Zielgruppe:

Wissenschaftler

E-Mail-Adresse:

Relevanz:

international

Sachgebiete:

Biologie, Chemie, Informationstechnik, Mathematik, Physik / Astronomie

Arten:

Eintrag:

04.04.2005

Absender:

Dr. Utz Lederbogen

Abteilung:

Stabsstelle Kommunikation und Marketing

Veranstaltung ist kostenlos:

nein

Textsprache:

Englisch

URL dieser Veranstaltung: http://idw-online.de/de/event13682


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