idw – Informationsdienst Wissenschaft
Nachrichten, Termine, Experten
Nachrichten, Termine, Experten
Wide Band Gap power semiconductors are entering ever more power electronics applications, as they offer lower switching losses compared to Silicon devices and thus enable higher switching frequencies. With decreasing losses, however, it is becoming increasingly important to achieve the highest possible precision for switching loss measurements, so that these devices can be utilized most effectively. For several years, the Double Pulse Test (DPT) has been a standard procedure to measure switching losses. However, this measurement principle is heavily dependent on the quality of the measurement equipment and the skills of the user operating it, especially when trying to measure switching losses of Silicon Carbide (SiC) or Gallium Nitride (GaN) power semiconductors.
With this expert seminar, we aim to highlight the relevance of the applied measurement equipment on the quality of the gathered switching loss data and to analyze its influence on measurement fidelity. The lectures emphasize the appropriate (and inappropriate) selection of probes for the measurement of fast transient signals, their influence on the quality and realism of the recorded waveforms, and possible measures to improve data quality.
The first day of the seminar conveys the fundamentals of DPTs and provides a compilation of best practices as well as possible pitfalls. Online participation is possible here.
The second day of the seminar covers practical lectures, combined with further deep-dive lectures about detailed error analyses as well as pre- and post-processing countermeasures to improve data accuracy.
The seminar is supported by practical examples and is based on the combined experience of the authors, sharing their engagement in the field of WBG characterization in multiple theses and high-class scientific publications on this topic.
Target Audience
Day 1 targets professionals who have little or no practical experience with DPTs, especially those performed on WBG power semiconductors. Attendees that seek to update their knowledge on available probing equipment or who previously have not yet worked with WBG can benefit as well.
Day 2 expands upon day 1 and provides further in-depth knowledge about intricacies of DPTs that are not obvious to most users, but that are of paramount importance for WBG characterization. Live training sessions on exemplary equipment enable participants to practically test this theoretical knowledge under the supervision of experienced instructors, thereby providing a strong link between theory and praxis.
Hinweise zur Teilnahme:
hybrid
Termin:
08.04.2025 - 09.04.2025
Veranstaltungsort:
Joseph-Beuys-Straße 8
34117 online | Kassel
Hessen
Deutschland
Zielgruppe:
Wirtschaftsvertreter, Wissenschaftler
Relevanz:
international
Sachgebiete:
Elektrotechnik, Energie, Informationstechnik, Maschinenbau, Umwelt / Ökologie
Arten:
Seminar / Workshop / Diskussion
Eintrag:
04.03.2025
Absender:
Uwe Krengel
Abteilung:
Pressestelle
Veranstaltung ist kostenlos:
nein
Textsprache:
Englisch
URL dieser Veranstaltung: http://idw-online.de/de/event78797
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