Zielgruppe: Erfahrene Nutzer der STN-Patentdatenbanken
Inhalte: Der Kurs vermittelt Ihnen Instrumente zur Nutzung von Patentstatistiken für Wettbewerbs- und Marktanalysen, Beobachtung von FuE-Trends, Analyse von Technologiepositionen und -feldern, jeweils in quantitativer, qualitativer und zeitlich-dynamischer Hinsicht. Weiter lernen Sie die praxisgerechte Aufbereitung von Rechercheergebnissen in aussagefähige Charts und Plots.
Information on participating / attending:
Date:
05/13/2004 09:00 - 05/13/2004
Event venue:
STN-Beratungszentrum Köln
Mathias-Brüggen-Str. 87-89
50829 Köln
Nordrhein-Westfalen
Germany
Target group:
Business and commerce, Scientists and scholars
Email address:
Relevance:
transregional, national
Subject areas:
Economics / business administration
Types of events:
Entry:
01/21/2004
Sender/author:
Rüdiger Mack
Department:
Marketingkommunikation
Event is free:
unknown
Language of the text:
German
URL of this event: http://idw-online.de/en/event10348
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