This workshop will give an overview of state of the art Raman and TERS imaging in addition to surface sensitive spectroscopy with AES, XPS and low energy EDS as well as AFM imaging.
Examples for advanced material characterisation beyond morphology (nano-chemical, nanoelectrical and nanomechanical properties) with a focus on carbon materials will be presented and demonstrated.
Attendees may bring their own, selected samples.
Topics
- Raman spectroscopy
- Tip-enhanced Raman spectroscopy
- Scanning probe microscopy (AFM, STM)
- Confocal Raman imaging
- Electron microscopy (SEM, EDX, STEM)
- Scanning Auger microscopy
- Chemical vapour deposition of carbon nanomaterials
Information on participating / attending:
Industry 130 Euro
Academics 90 Euro
Students free
Date:
10/05/2016 09:00 - 10/05/2016 21:00
Event venue:
Markwiesenstrasse 55, Innovationsforum
72770 Reutlingen
Baden-Württemberg
Germany
Target group:
Business and commerce, Scientists and scholars
Email address:
Relevance:
transregional, national
Subject areas:
Materials sciences, Physics / astronomy
Types of events:
Conference / symposium / (annual) conference, Seminar / workshop / discussion
Entry:
08/17/2016
Sender/author:
Dr. Nadja Gugeler
Department:
Pressestelle
Event is free:
no
Language of the text:
English
URL of this event: http://idw-online.de/en/event55100
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