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04/26/2021 - 04/28/2021 | Online

Correlative Materials Characterization

Research and development in materials characterization techniques are increasingly needed for modern materials science, for innovation in high-tech branches and to guarantee the functionality, performance and reliability of advanced products. In this context, Correlative Materials Characterization using various techniques has the potential for a significant impact in the field of materials science and engineering.

With this novel approach, correlative microscopy will be expanded by including spectroscopic techniques and diffraction. In this advanced training course, we will consider the whole chain from equipment hardware through data acquisition strategies up to advanced data analysis including the application of AI algorithms. We will demonstrate how the scientific community will be able to benefit from access to rapidly expanding data sets generated by (correlative) materials characterization, and how the use of machine learning algorithms in image analysis (2D and 3D) and data analysis (spectra, diffraction patterns, etc.) enable materials scientists to uncover new types of structures in large amounts of data in an efficient way.

DAY 1

Correlative materials characterization of hierarchical materials
and thin films

09:00
Welcome and introduction:
Multi-scale and correlative materials characterization
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

10:45
Hierarchical materials
Prof. Dr. Wilhelm Schwieger, Friedrich Alexander Universität Erlangen-Nürnberg (Germany)

12:00
Hyperspectral and multispectral imaging
Dr. Wulf Grählert, Fraunhofer Institute for Material and Beam Technology Dresden (Germany)

DAY 2

Correlative microscopy with or in electron microscopes

09:00
SEM, FIB and TEM for 3D imaging and correlative studies
Prof. Dr. Eva Olsson, Chalmers University of Technology Gothenburg (Sweden)

10:45
Correlative light and electron microscopy to study the dynamics and ultrastructure of biological samples
Prof. Dr. Thomas Müller-Reichert, Technische Universität Dresden (Germany)

12:00 Correlative probe and electron microscopy using AFM-in-SEM
Dr. Jan Neuman, NenoVision Brno (Czech Republic)

DAY 3

X-ray techniques and correlative materials characterization

09:00
Multi-scale X-ray computed tomography
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

10:15
Spectromicroscopy at the synchrotron
Prof. Dr. Gerd Schneider, Helmholtz Zentrum Berlin (Germany)

Advanced data analysis

11:30
Machine learning algorithms for the analysis of spectroscopy data
Dr. Janis Timoshenko, Fritz Haber Institut of Max Planck Gesellschaft Berlin (Germany)

12:30
Summary and final remarks
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

Information on participating / attending:
Event Dates in detail:

Day 1: 09:00 - 13:00
Day 2: 09:00 - 13:00
Day 3: 09:00 - 13:00

Dial-in Information will be send by e-mail to the participants one day before the training course starts.

The software ZOOM will be used for the training course.

Date:

04/26/2021 09:00 - 04/28/2021 13:00

Event venue:

Online
Online
Nordrhein-Westfalen
Germany

Target group:

Business and commerce, Scientists and scholars

Email address:

Relevance:

international

Subject areas:

Materials sciences

Types of events:

Seminar / workshop / discussion

Entry:

02/02/2021

Sender/author:

Jörg Bähren

Department:

Kommunikation & Medien

Event is free:

no

Language of the text:

English

URL of this event: http://idw-online.de/en/event67860


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