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Image for: Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023


Dr. Michael Hippler, Managing Director of Rigaku Europe SE, Dr. Christian Reimann and Dr. Christian Kranert from Fraunhofer IISB with their award certificate in front of the Rigaku XRTmicron tool at the Center of Expertise for X-ray Topography at the IISB
Dr. Michael Hippler, Managing Director of Rigaku Europe SE, Dr. Christian Reimann and Dr. Christian Kranert from Fraunhofer IISB with their award certificate in front of the Rigaku XRTmicron tool at the Center of Expertise for X-ray Topography at the IISB

Elisabeth Iglhaut

Elisabeth Iglhaut / Fraunhofer IISB

(4155 KB, 3543 x 2362 pixels)

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