idw – Informationsdienst Wissenschaft
Nachrichten, Termine, Experten
Nachrichten, Termine, Experten
Fokus ultrascharf: Bei der Abbildung von Gitterdefekten in Diamantkristallen erreicht man mit der überauflösenden STED-Mikroskopie einen 28-mal schärferen fokalen Lichtfleck als mit herkömmlichen Fluoreszenzmikroskopie-Verfahren
Source: Bild: Rittweger & Hell / MPIbpc
(441 KB, 657 x 658 pixels)
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The Science Year 2025 of the Federal Ministry of Education and Research (Bundesministerium für Bildung [...]
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