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Image for: Neue Messmethode ermöglicht detaillierte Rückschlüsse über radioaktives Material


Für die neue Methode wird eine kommerzielle TOF-SIMS Anlage (sog. Statische Secondary ion mass spectrometry) mit Lasern gekoppelt, die die verschiedenen Elemente selektiv ionisieren.
Für die neue Methode wird eine kommerzielle TOF-SIMS Anlage (sog. Statische Secondary ion mass spectrometry) mit Lasern gekoppelt, die die verschiedenen Elemente selektiv ionisieren.

Hauke Bosco/IRS

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