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Image for: Auf Betriebstemperatur: Statistische Charakterisierung von Halbleiter-Qubits bei 2 Kelvin


Neuartiger kryogener On-Wafer-Prober, der im Rahmen des Projekts »KryoproPlus« am Fraunhofer IAF erstmals in Europa die statistische Vermessung von Qubits auf 8-Zoll- und 12-Zoll-Wafern bei unter 2 K ermöglichen soll.
Neuartiger kryogener On-Wafer-Prober, der im Rahmen des Projekts »KryoproPlus« am Fraunhofer IAF erstmals in Europa die statistische Vermessung von Qubits auf 8-Zoll- und 12-Zoll-Wafern bei unter 2 K ermöglichen soll.

Bluefors Oy

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