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Image for: Cryogenic on-wafer prober determines quality of qubit devices for quantum computing and quantum sensing


The cryogenic on-wafer prober at Fraunhofer IAF enables fully automatic characterizations of up to 25 whole 200-mm or 300-mm wafers with devices for quantum computing and sensing.
The cryogenic on-wafer prober at Fraunhofer IAF enables fully automatic characterizations of up to 25 whole 200-mm or 300-mm wafers with devices for quantum computing and sensing.

© Fraunhofer IAF

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