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Image for: Charakterisierungsmethode für SiC-Wafer mittels Röntgentopographie mit Georg-Waeber-Innovationspreis 2023 ausgezeichnet


Dr. Michael Hippler, Geschäftsführer der Rigaku Europe SE, Dr. Christian Reimann und Dr. Christian Kranert vom Fraunhofer IISB mit ihren Preisurkunden vor dem Rigaku XRTmicron Röntgentopographiegerät im Center of Expertise for X-ray Topography am IISB.
Dr. Michael Hippler, Geschäftsführer der Rigaku Europe SE, Dr. Christian Reimann und Dr. Christian Kranert vom Fraunhofer IISB mit ihren Preisurkunden vor dem Rigaku XRTmicron Röntgentopographiegerät im Center of Expertise for X-ray Topography am IISB.

Elisabeth Iglhaut

Elisabeth Iglhaut / Fraunhofer IISB

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