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Image for: Neues Verständnis der Defektbildung an Silizium-Elektroden


Inhomogenitäten in der äußeren SEI-Schicht (rot) führen beim Laden zu unterschiedlichen Lithium-Anteilen in der Silizium-Anode (gelb/grau), sodass es zu Rissen und anderen Defekten kommt.
Inhomogenitäten in der äußeren SEI-Schicht (rot) führen beim Laden zu unterschiedlichen Lithium-Anteilen in der Silizium-Anode (gelb/grau), sodass es zu Rissen und anderen Defekten kommt.

C. Chen et al

C. Chen et al., Nature Communications, https://doi.org/10.1038/s41467-020-17104-9 (CC BY 4.0)

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