idw – Informationsdienst Wissenschaft
Nachrichten, Termine, Experten
Nachrichten, Termine, Experten
Due to shorter development times and higher demands on electronic components and systems, the role of reliability assessment is constantly gaining in importance. Fraunhofer IZM is organizing a two-day seminar to provide participants with the relevant methods and tools along the product development process. The programme has been carefully curated to cover the reliability aspects of electronic systems in all development phases. The two-day seminar will be held in English.
Knowing a system’s reliability is knowing the key to success
The developers of modern electronic components and systems are facing a double challenge: Meeting ever more stringent requirements in ever faster-paced development cycles. In this situation, understanding their systems’ reliability becomes a crucial factor.
Topics are:
- Definitions and introduction to important terms
- Methods for system assessments
- Stress impacts and resulting failure mechanisms
- Empirical and analytical failure modelling
- Systematics of FE simulation
- Implementation of realistic stress tests
- Analyzing and interpreting of test results
- Handling of reliability characteristics
- Assuring reliability by condition monitoring
- Analytical measurement methods
The two-day event will be held by the specialists of the department »Environmental and Reliability Engineering« at Fraunhofer IZM in Berlin. Participants are taught methods and background knowledge for ensuring reliability in the development and production
process of electronic systems.
The first day of the seminar starts with the establishment of a common understanding of terms and definitions. Moreover, methods will be presented for the examination of systems
and determination of boundary conditions allowing the evaluation of system reliability. In order to predict the expected lifetime, application-specifi c load profi les are derived and
correlated with test profiles.
On the second day of the event, capabilities and limits of numerical simulation are presented as a useful tool in earlystage development. The importance of structural analysis and material characterization for quantitative reliability prediction will be discussed and different methods of gathering information about reliability in tests and in the fi eld will be introduced.
The first day will include a lab tour. On the second day, a workshop will give the participants the opportunity to apply the acquired knowledge under supervision. The overall focus is on long-term knowledge transfer.
More information and registration: https://www.izm.fraunhofer.de/en/news_events/trainings-and-workshops/ws_12.html
Hinweise zur Teilnahme:
Registration:
Please register via the online tool on the event website: https://www.izm.fraunhofer.de/en/news_events/trainings-and-workshops/ws_12.html.
The max. number of participants is 30.
Attendance Fee: 850 € (exempt from sales tax, § 4 No.
22 UStG).
Seminar documents as well as lunch, drinks
and a dinner event are included.
Who should attend: The seminar is primarily aimed
at engineers in the fi elds of development, technology,
production, manufacturing and quality assurance.
Termin:
10.11.2022 ab 10:00 - 11.11.2022 16:00
Veranstaltungsort:
Location: The seminar takes place at Fraunhofer
Institute for Reliability and Microintegration IZM
Gustav-Meyer-Allee 25 | 13355 Berlin
13355 Berlin
Berlin
Deutschland
Zielgruppe:
Wirtschaftsvertreter, Wissenschaftler
E-Mail-Adresse:
Relevanz:
überregional
Sachgebiete:
Elektrotechnik, Energie, Umwelt / Ökologie
Arten:
Seminar / Workshop / Diskussion
Eintrag:
02.08.2022
Absender:
Susann Thoma
Abteilung:
Presse- und Öffentlichkeitsarbeit
Veranstaltung ist kostenlos:
nein
Textsprache:
Englisch
URL dieser Veranstaltung: http://idw-online.de/de/event72163
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